Description: High Reliability Screening of Semiconductor and Integrated Circuit Devices, by J. Lombardi, L. McDonough, and H. Padden, prepared by Grumman Aircraft Engineering Corporation, Bethpage, NY, for Goddard Space Flight Center, April, 1967 — 149 pages — 19 Tables — 67 illustrations. Contents: AcknowledgementsForewordPart 1: Test SpecificationsGeneral Specification for Digital Integrated CircuitsPart 2: Specification Development and Test ResultsTest Specification DevelopmentNon-Destructive Test ResultsDestructive Test StudiesAppendix:Test DataBibliographyList of 19 TablesList of 67 Illustrations
Price: 37.9 USD
Location: Hilliard, Ohio
End Time: 2024-08-11T21:18:00.000Z
Shipping Cost: 5.38 USD
Product Images
Item Specifics
All returns accepted: ReturnsNotAccepted
Binding: Softcover, Wraps
Place of Publication: Washington, DC
Signed: No
Publisher: Grumman Aircraft Engineering Corporation
Subject: Semiconductor and Integrated Circuit Devices
Original/Facsimile: Original
Year Printed: 1967
Pages: 149
Unit Type: Unit
Language: English
Illustrator: Grumman Aircraft Engineering Corp.
Special Attributes: Illustrated
Author: J. Lombardi, L. McDonough, and H. Padden
Region: North America
Personalized: No
Topic: Electronics
Country/Region of Manufacture: United States
Unit Quantity: 1
Character Family: Semiconductor and Integrated Circuit Devices
